双应力步进加速退化试验统计分析研究--模型与方法  

Study on Statistical Analysis for Step-stress Accelerated Degradation Tests with Two Accelerating Stresses——Models and Methods

作　　者：汪亚顺[1] 莫永强[1] 张春华 陈循[1] 何有 

机构地区：[1]国防科学技术大学机电工程与自动化学院,湖南长沙410073 [2]空军驻华中地区可靠性专业军事代表室,湖北武汉430077

出　　处：《兵工学报》2009年第4期451-456,共6页Acta Armamentarii

摘　　要：针对新研制、高可靠、长寿命产品样本量小的特点及单一加速应力水平的极限问题,提出双应力交叉步进加速退化试验方法,实现其寿命及可靠性评估。通过建立包含剩余标准化系数的退化轨迹模型,描述退化量与应力水平相关产品的性能退化规律。利用基于累积损伤模型及时间折算的模型参数估计方法进行加速退化数据的统计分析,得到产品在使用应力水平下的寿命及可靠性信息。以具有退化失效特点的典型电真空器件电子倍增器为对象进行方法应用,应用结果验证了该方法的有效性。Taking aim at the small sample size and the limilation of single accelerating stress level, step-stress accelerated degradation test （ADT） with two accelerating stresses is a good way to evaluate reliability or life-time for newly developed products. A method to analyze data obtained in step-stress ADT with two accelerating stresse was presented. A degradation path model including residual standardized coefficients was presented to describe degradation path for products with degradation correlating with stress levels. Degradation data were analyzed to obtain life and reliability information with a method based on cumulati,ve exposure model and time transformation. An example of analysis for data of electronic multipliers is provided to illustrate the proposed method and its validity.

关 键 词：数理统计学 加速退化试验 步进应力加速退化试验 双应力 统计分析 可靠性 

分 类 号：TB114.3[理学—概率论与数理统计]