喷气箍缩等离子体X射线椭圆弯晶谱仪研究  

Elliptical Crystal Spectrometer for Gas-puff-Pinch Plasma X-Ray

作　　者：王洪建[1,2] 肖沙里[1] 施军[1] 黄显宾[3] 杨礼兵[3] 蔡红春[3] 周少彤[3] 张思群[3] 姜蓉蓉 

机构地区：[1]重庆大学光电技术及系统教育部重点实验室,重庆400030 [2]重庆工商大学,重庆400067 [3]中国工程物理研究院流体物理研究中心,四川绵阳621900

出　　处：《光子学报》2009年第5期1212-1215,共4页Acta Photonica Sinica

基　　金：国家自然科学基金联合基金(NSAF,10576041);中国高技术研究发展计划资助

摘　　要：为了测量喷气箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪.分别利用Si(111)、Mica(002)椭圆晶体作色散元件,离心率均为0.9480,布喇格角为30～67.5°,光谱信号采用半径为50mm的半圆形胶片接收,从等离子体源经晶体到胶片的光路长为1430mm.在"阳"加速器装置上进行摄谱验证实验,成功获取了氩喷气等离子体X射线的光谱.测量光谱波长与理论值相符,其中Si弯晶获得的光谱分辨率(λ/Δλ=200～300)低于Mica弯晶获得的光谱分辨率(λ/Δλ=500～700).实验结果表明,该谱仪适合于喷气箍缩等离子体X射线的光谱学研究.To diagnose the presence of ion-beams in gas-puff pinch plasma,a new space resolved focusing elliptical curved crystal spectrometer was developed based on focusing spectrograph spatial resolution （FSSR）. Si（lll） and Mica（002） crystal were employed as dispersive elements with 0. 948 0 eccentricity, which covered Bragg angels in the range of 30-67.5°. The experimental verification of the technique was carried out on the Yang accelerator facility and aimed to investigate the characteristics of high-density plasma. X-ray spectra in an absolute intensity scale were obtained from argon gas-puff pinch plasmas recorded by a half-circle film with 50 mm radius. The long designed path of the X-ray spectrometer beam was 1 430 mm from the source to the crystal and the detector. It was demonstrated experimentally that the measured wavelength was consistent with the theoretical value, He-like spectral resolution λ/△λ. of 5004 700 for the mica and λ/△λ：200-300 for Si crystal spectrometers. It was also shown that the spectrograph of elliptical bent crystal was well suited to the analysis of the x-ray emission from a gas-puff pinch plasmas source.

关 键 词：X光光谱仪 光谱学 椭圆弯晶 喷气箍缩 等离子体 

分 类 号：TH744.15[机械工程—光学工程] O434.13[机械工程—仪器科学与技术]