双CCD光栅投影法测量物体三维轮廓技术  

Technology of Double CCD 3D Profile Measurement Using Grating Project

作　　者：田爱玲[1] 刘洋[1] 郭迎福[2] 刘丙才[1] 王红军[1] 

机构地区：[1]西安工业大学光电工程学院,西安710032 [2]湖南科技大学机电工程学院,湖南411201

出　　处：《西安工业大学学报》2009年第2期108-112,共5页Journal of Xi’an Technological University

基　　金：湖南科技大学湖南省机械设备健康维护重点实验室开放基金

摘　　要：为了实现物体三维轮廓的高精度测量,使用双CCD采集被物体调制的光栅图像,将四步相移法与图象编码法相结合对采集到的图像进行处理,得到物体上各个点的相位变化,根据相位变化求出物点相对于参考面的高度,从而获得物体的三维轮廓信息.实验表明,此方法测量信息获取完整,可以测量陡峭或不连续的物体,测量误差在0.05 mm以内.Double CCD collected image grating modulated by the object is used in order to achieve 3D profile high-precision measurement. The four steps phase shift method and image code method are used to process the image. Then the phase change of every point on the object is obtained. According to the phase change,the height of the point on the object relative to the reference plane is calculated. Thus the 3D profile information o（ the object is got. Experiments indicate that by this technique, integral measurement information is collected, steep or discontinuous object is measured, the measurement error is less than 0. 05 mm.

关 键 词：光栅投影 三维轮廓测量 图象编码 四步相移 

分 类 号：TP274.4[自动化与计算机技术—检测技术与自动化装置]