Zn^(2+)对304L不锈钢钝化膜半导体性能的影响  

Influence of Zn^(2+) on Semiconducting Performance of Passive Films on 304 Stainless Steel

作　　者：张胜寒[1] 贾利[1] 檀玉[1] 

机构地区：[1]华北电力大学环境科学与工程学院,河北保定071003

出　　处：《材料保护》2009年第6期11-13,共3页Materials Protection

摘　　要：Zn2+对304L不锈钢钝化膜半导体性能的影响目前鲜见报道。利用电容测量法研究了304L不锈钢在一系列ZnSO4浓度溶液中所形成的钝化膜的半导体性能,同时对影响钝化膜半导体性能的因素进行了讨论。考虑SO42-对不锈钢钝化膜的影响,在相同温度和浓度的条件下进行了Na2SO4中的浸泡对比试验。结果表明:在电位小于-0.4V内,膜呈p型半导体特性,电位处于-0.4～0.3V内,膜呈n型半导体特性;随着测试温度的升高及Zn2+浓度的增加,Mott-Schottky曲线的斜率有增大的趋势,膜内的杂质浓度减小。The semiconducting performance of the passivation films on 304 stainless steel,prepared from a series of ZnSO4 solution with different concentrations,was investigated by measuring the electric capacity.At the same time,by taking into account the effect of SO42-on the passivation films on stainless steel,comparative im-mersion tests in Na2SO4 solution were conducted at the same tem-perature and concentration.This aims at revealing the factors af-fecting the semiconducting performance of the passivation films.Results indicate that at an electric potential of smaller than-0.4 V,the passivation film was dominated by p type semiconductor characteristics.When the electric potential was ranged within-0.4～0.3 V,the passivation film was dominated by n type semi-conductor characteristics.Moreover,the slope of the Mott-Schott-ky curve tended to increase with increasing concentration of Zn and test temperature as well,indicating that the concentration of impurities in the passivation film was reduced therewith.

关 键 词：钝化膜 半导体性能 304L不锈钢 电容测量法 Zn2+ Mott-Schottky曲线 杂质浓度 

分 类 号：TN304[电子电信—物理电子学]