集成高速动态分频器的倍频移相扫描电光测量  

Measurement and Analyses of Integrated High Speed Dynamic Decision Using Double Frequency Phase Shift Scanning in Electro Optic Sampling

作　　者：田小建[1,2] 衣茂斌[1,2] 孙伟[1,2] 张大明[1,2] 高艳君[1,2] 

机构地区：[1]集成光电子学国家重点联合实验室吉林大学实验室 [2]吉林大学电子工程系

出　　处：《Journal of Semiconductors》1998年第7期528-531,共4页半导体学报（英文版）

摘　　要：本文测量了集成高速动态分配器的延迟时间，转移特性曲线以及内部点的波形．介绍了倍频移相电光取样方法。Abstract Integrated high speed dynamic decision circuits have been measured. The measurements include the propagation delays, transfer characteristic curve and waveform at relevant internal points.The double frequency phase shift scanning in electro optic sampling is described. The two kinds of signal detection method that are the synchronization detection and the digital average are compared.

关 键 词：高速集成电路 倍频移相 砷化镓 测量 

分 类 号：TN430.7[电子电信—微电子学与固体电子学] TN304.23