电子迁移对钇稳定氧化锆电解质性能的影响  

Effects of Electron Mobility on Yttria-stabilized Zirconia

作　　者：鲁盛会[1] 向蓝翔[1] 周欣燕[1] 陈宗璋[2] 李素芳[2] 沙顺萍[1] 

机构地区：[1]中国原子能科学研究院,北京102413 [2]湖南大学化学化工学院,长沙410082

出　　处：《材料开发与应用》2009年第3期23-26,共4页Development and Application of Materials

摘　　要：本文讨论了在不同测氧分压、温度、相对密度及引入A l2O3下,电子迁移对钇稳定氧化锆电解质性能的影响。结果表明:氧化锆氧浓差电池测量的氧分压越低,电子迁移对池电势的影响越大;电池的工作温度越低,电子迁移数越大,测量误差越大;烧结越致密的电解质其电子迁移数越小;适量的引入A l2O3可以降低电子迁移数,提高测氧准确性。The electron mobility was measured to investigate the influence of test temperature, densification, oxygen concentration and doped alumina on performance of yttria-stahilized zirconia （YSZ）. The result shows that the lower oxygen concentration in testing electrode, the more influence of electron mobility on potential of YSZ cell and the amount of electron mobility is larger at lower work temperature to oxygen sensor. The high sintering density of YSZ and proper addition of alumina can decrease the amount of electron mobility and increase the accuracy of oxygen sensor.

关 键 词：氧化锆 电子迁移 氧传感器 

分 类 号：TQ174[化学工程—陶瓷工业]