钒的Kβ谱带精细结构的测定及钒的价态分析  

Study on Vanadium's Kβ Emission Spectra and Valence Analysis of Vanadium

作　　者：孙伟莹[1] 谭秉和[1] 

机构地区：[1]北京科技大学化学系

出　　处：《岩矿测试》1998年第2期107-111,共5页Rock and Mineral Analysis

基　　金：冶金部重点科研项目

摘　　要：用普通Ｘ射线荧光光谱仪测定了钒的氧化物、钒酸盐及含钒混合物中Ｖ的Ｋβ谱线，借助一套有效的谱处理程序，获得了有关Ｋβ谱线精细结构的谱峰参数，证实了谱线轮廓（Ｋβ″峰逐渐显著，Ｋβ５、Ｋβ″向高能端位移，Ｋβ５与Ｋβ１，３的分开趋势，Ｋβ１，３半峰宽发生变化）及谱峰参数（Ｋβ５峰能量，Ｋβ５与Ｋβ１，３能量差，Ｋβ５与Ｋβ１，３及Ｋβ″与Ｋβ１，３的强度比，以及Ｋβ５和Ｋβ１，３的不对称因子）与Ｖ的氧化数变化呈很强的相关性及规律性变化。Kβ emission spectra of vanadium from its oxide, mixtures and vanadate were studied by common X-ray fluorescence spectrometer. Spectra parameters about fine structure of Kβ of vanadium were obtained by using an effective spectrum processing software. Dependence of regular patterns of the variations in profile and parameter of Kβ spectra on valence of vanadium was also investigated.

关 键 词：化学价态分析 X射线荧光光谱 钒 光谱仪 

分 类 号：O614.511[理学—无机化学]