多馈入短路比及多馈入交互作用因子与换相失败的关系  

Relationship of Multi-Infeed Short Circuit Ratio and Multi-Infeed Interaction Factor With Commutation Failure

作　　者：刘建[1] 李兴源[1] 傅孝韬[1] 徐梅梅[1] 贺洋[1] 

机构地区：[1]四川大学电气信息学院,四川省成都市610065

出　　处：《电网技术》2009年第12期20-25,共6页Power System Technology

基　　金：国家重点基础研究专项经费项目(2004CB217901);"十一五"国家科技支撑计划资助项目(2008BAA13B01);国家自然科学基金资助项目(50577044)~~

摘　　要：将传统的两端直流系统短路比延伸到多馈入直流系统,建立了多馈入短路比(multi-infeed short circuit ratio,MSCR)表达式。基于CIGRE模型建立了三馈入直流输电模型,分析了与MSCR相关的变量,并结合换相失败免疫因子得出结论:增大多馈入短路比能够降低发生当地换相失败的风险。同时从多馈入交互作用因子的角度分析了发生同时换相失败的规律:减小交互作用因子能够降低同时换相失败的风险。Extending traditional short-circuit ratio of two-terminal DC system to multi-infeed DC system, an expression of multi-infeed short current ratio （MSCR） is established. Based on CIGRE model a 3-infeed DC power transmission model is built and the variables related to MSCR are analyzed and the relation between MSCR and local commutation failure is researched. Combined with commutation failure immunity index （CFII）, following conclusion is obtained： increasing MSCR can reduce the risk of local CF. Meanwhile, from the viewpoint of multi-infeed interaction factor （MIIF）, the risk law that simultaneous commutation failures occur is analyzed and it is proposed that decreasing multi-infeed interaction factor （M/IF） can reduce the risk of simultaneous CFs.

关 键 词：高压直流输电 换相失败(CF) 多馈入短路比(MSCR) 多馈入交互作用因子(MIIF) 

分 类 号：TM721.1[电气工程—电力系统及自动化]