ZrO_2氧空位显微结构的高分辨电镜研究  

Analyzing the Oxygen Vacancy Microstructure of ZrO_2 by High Resolution Electron Microscope

作　　者：梁超伦[1] 江丹[1] 黄烘[1] 程小宁[1] 赵文霞[1] 

机构地区：[1]中山大学测试中心,广东广州510275

出　　处：《分析测试学报》2009年第6期749-752,共4页Journal of Instrumental Analysis

基　　金：国家自然科学基金资助项目(40772046);中山大学青年教师启动基金资助项目(2004-05040-1131068)

摘　　要：基于透射电镜X射线能谱仪得到的微区成分信息及高分辨电子显微结构信息,构建具有氧空位缺陷的ZrO2晶体结构模型,用200 kV透射电子显微镜的参数进行高分辨实验像的多片层法模拟计算,观察分析了ZrO2多晶材料样品的晶格缺陷。沿[001]方向的二维晶格像及相应的傅立叶变换像显示出ZrO2样品的晶格缺陷。将计算机模拟结果与高分辨实验像进行比较,结果表明计算机模拟像的衬度及周期性与实验像之间符合良好。根据晶体结构的缺陷模型和模拟计算,阐明了氧空位缺陷引起的实验像衬度的变化。通过高分辨电子显微观察结果及计算机模拟结果,揭示了陶瓷ZrO2多晶材料样品晶格中氧空位的存在。Crystal structural defects of ZrO2 ceranfic have been investigated by high resolution electron microscope（HREM） in combination with lattice image simulations. Based on the micro structural information of ZrO2 ceramic obtained by HREM lattice images and stoichiometrie composition determined by X-ray energy dispersive spectroscopy（EDS）, a defective crystal structure model with oxygen vacancies was constructed. According to the ZrO2 defect structure model, HREM image simulations was calculated by transmission electron microscopy （TEM） with a acceleration potential of 200 kV using muhislice approach. Two-dimensional lattice images with electron beam along [ 001 ] zone axis and the corresponding fast Fourier transfer（FFT） images indicated that periodicity and contrast of the simulation image were in good agreement with those of the experimental image. The results also showed that oxygen vacancies existed in ZrO2 polycrystalline ceramic and the presence of oxygen vacancies in the crystalline lattice led to the formation of HREM image contrast variations.

关 键 词：ZRO2 氧空位 高分辨电子显微学 计算机模拟像 

分 类 号：Q246[生物学—细胞生物学] P578.94[天文地球—矿物学]