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作 者:李娜[1] 刘鹏宇[1] 颜广炅[1] 张丽[1] 刘冰心[1] 张卓[1]
机构地区:[1]北京有色金属研究总院分析测试技术研究所,北京100088
出 处:《稀有金属》2009年第3期450-452,共3页Chinese Journal of Rare Metals
基 金:国家科技部新技术新方法(2005JG200030)资助项目
摘 要:研究建立了ICP-AES同时测定磁制冷材料钆硅锗系合金中Mo,Mn,Al,V,Ni,Cu,Ga,Fe,Ca(含量范围为质量分数0.1%~1%)9种杂质元素的分析方法。方法的检出限为0.003~0.1μg.ml-1,测定下限为0.02~0.5μg.ml-1,回收率在94%~108%,对于杂质质量分数为0.1%,0.5%,1.0%的样品,其RSD分别为0.40%~2.6%,0.52%~1.1%,0.67%~1.3%,结果表明该方法的精密度和准确度均满足微量分析的要求。A new method for determination of trace elements, such as Mo, Mn, Al, V, Ni, Cu, Ga, Fe and Ca in magnetic refrigeration material, GdSiGe series alloys, was developed with ICP-AES. Detection limit and determination limit of the method were 0. 003 - 0.1 g· ml^ -1 and 0.02 - 0.5 g· ml^ - 1 respectively. The recovery rate was 94% -108%. The relative standard deviations ( n = 10 ) of the sample ( the content of impurity was 0. 1% ,0.5%, 1.0% ) were 0.40%-2.6% , 0.52%- 1.1%, 0.67%- 1.3% , respectively. The results showed that the method had good accuracy and precision, and could meet the requirements of microanalysis.
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