表面光伏谱在光电材料与器件研究中的应用  

Application of the Surface Photovoltage Spectroscope in the Photovoltaic Material and Devices

作　　者：周紫光[1] 刘爱民[1] 刘维峰[1] 刘艳红[1] 

机构地区：[1]大连理工大学物理与光电工程学院,辽宁大连116024

出　　处：《半导体技术》2009年第7期679-683,714,共6页Semiconductor Technology

摘　　要：利用表面光伏谱可测光电材料的禁带宽度、导电类型、表面态能级和少数载流子扩散长度等。分析了表面光伏技术的非破坏性、快速和高灵敏度等方面的优点,指出它可以在一个合适的温度范围内对任何环境下的任何半导体材料进行测量分析。研究表明,随着激光光源的应用、微弱信号检测水平的提高和计算机技术的发展,表面光伏技术的测量精度越来越高,可更加准确地分析半导体的能级结构和电子跃迁转移现象,因此必然会在光电材料与器件的研究中得到更为方泛的应用。Surface photovoltage spectroscope （SPS） can be used for measuring the properties of the photovohaic material, such as bandgap, conductive type, surface states, minority carrier diffusion length and so on. SPS technique has the advantages of non-destructive, quick and high sensitivity. It is pointed out that measurements using SPS can be performed at any reasonable temperature, on any semiconducting material, at any ambient. It shows that with the application of laser source, the improvement of weak signal measurement and the development of computer technique, SPS technique may be more precise and more suitable for the analysis of band diagram and electron transition. So SPS technique will be more wildly used in the field of photovohaic material and devices.

关 键 词：表面光伏谱 光电材料 太阳能电池 

分 类 号：TN304[电子电信—物理电子学]