铂膜温度传感器可靠性定级加速试验研究  

Research on reliability grading acceleration test of Pt film temperature sensor

作　　者：郭建英[1] 丁喜波[1] 孙永全[1] 刘新华[1] 

机构地区：[1]哈尔滨理工大学测控技术与通信工程学院,哈尔滨150080

出　　处：《仪器仪表学报》2009年第6期1129-1133,共5页Chinese Journal of Scientific Instrument

基　　金：国家自然科学基金(60072002)资助项目

摘　　要：针对电子元器件可靠性定级试验面临的困难,结合铂膜温度传感器可靠性研究,探讨了一种可实现的定级加速试验。在分析失效机理的基础上,选定了Arrhenius加速模型,求得激活能与待定常数。利用铂膜温度传感器多功能测试系统,完成铂膜温度传感器可靠性定级加速试验。结果表明,在控制抽样数条件下,明显地缩短了试验时间,对工程实践有重要参考价值。In view of the issue that is difficult to do failure rate grading test for electronic components, according to the research on Pt film temperature sensor reliability, a realizable acceleration test method is discussed in the paper. Based on the analysis of failure mechanism, Arrhenius acceleration test model is selected, the parameters AE and C is evaluated , the Pt film temperature sensor test system is used, and a new accelerate life test plan for grading test of Pt film temperature sensor is developed. The result of samples shows that this method can reduce test time significantly with the same number of samples. It is valuable in practical engineering.

关 键 词：失效率 铂膜温度传感器 可靠性定级试验 加速寿命试验 

分 类 号：TB114.3[理学—概率论与数理统计]