SiO2胶体探针的制备及其在表面力测定中的应用  

Preparation of SiO_2 colloidal probes and their application in the measurement of surface forces in AFM

作　　者：臧利杰[1,2] 葛小鹏[1] 涂华民[2] 王东升[1] 刘华亭[2] 汤鸿霄[1] 

机构地区：[1]中国科学院生态环境研究中心环境水质学国家重点实验室,北京100085 [2]河北师范大学化学与材料科学学院,河北石家庄050016

出　　处：《电子显微学报》2009年第3期214-218,共5页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金面上项目(No.20677073)

摘　　要：采用一种新方法——双向三维移动平台法制备胶体探针,该方法使用两个三维移动平台,同时将CCD与长工作距离显微镜集成,组成视频监视系统来监控探针的整个制备过程,方便了操作。利用此自组装装置制备的二氧化硅胶体探针在原子力显微镜上进行力曲线测量,将分析数据与Ducker的经典论文进行对照,得到较为理想的结果。A new method for the preparation of colloidal probes has been developed by using a dual-way 3D movement platform. It uses two 3D micromanipulators for the precise positioning of both the cantilever probe and the particle, which facilitates their movement with each other. A video CCD Camera integrated into the microscope system with a long working distance has been used for monitoring the whole process of colloidal probe fabrication. Silicon colloidal probes are then made with this newly invented device and used in the AFM force curves collection with good results.

关 键 词：原子力显微镜 胶体探针 针尖制备 力曲线 

分 类 号：O613.72[理学—无机化学]