雷达系统测试性设计  

The Design for Testability of Radar System

作　　者：赵继承[1] 顾宗山[2] 吴昊 马红星 

机构地区：[1]海军装备部驻上海地区军事代表局,上海201206 [2]中国电子科技集团公司第三十八研究所,安徽合肥230031 [3]海军驻合肥地区军事代表室,安徽合肥230031

出　　处：《雷达科学与技术》2009年第3期174-179,共6页Radar Science and Technology

摘　　要：良好的测试性设计对雷达系统而言,可以有效地提高其维修性、保障性,降低全寿命周期费用。简要回顾了测试性的发展,指出了测试性设计对雷达系统的重要性和必要性,并给出了雷达系统的测试性设计的基本原则。从网络化设计、分层次设计、外场可更换模块(LRM)设计、校正维护设计和故障诊断设计等方面详细介绍了雷达系统的机内测试(BIT)设计,对原位检测设计和自动测试设备(ATE)设计进行了简要介绍。随着雷达技术的不断发展,在BIT技术、ATE技术进行创新发展的同时,还应积极探索综合诊断技术、预测和健康管理(PHM)技术等新的诊断方法在雷达系统测试性设计中的应用。For radar system, great testability design can improve the maintainability and supportability, and reduce the full life-cycle costs. The development of testability is briefly reviewed. The importance, needs and design principles of the design for testability of radar system are indicated. The designs of built-in test （BIT） are discussed in detail, including networked design, layered design, line replaceable module（LRM） design, calibration and maintenance design and diagnostics design. The in-situ testing and automatic test equipment（ATE） for radar system are also introduced. With the continuous advancement of radar technology, the BIT and ATE techniques will be developed and innovated, and the applications of integrated diagnostics, prognostics and health management（PHM） techniques should be explored.

关 键 词：雷达 测试性 机内测试(BIT) 原位检测 自动测试设备(ATE) 

分 类 号：TN956[电子电信—信号与信息处理]