基于有向图的BIT级联虚警分析  

Analysis of False Alarm of Concatenated BIT Based on Directed Graph

作　　者：池程芝[1] 章卫国[1] 刘小雄[1] 

机构地区：[1]西北工业大学自动化学院,陕西西安710072

出　　处：《计算机测量与控制》2009年第7期1243-1244,1275,共3页Computer Measurement &Control

摘　　要：机内测试(BIT)是一种提高系统测试性和诊断能力的重要技术,然而系统部件之间及部件内部存在的关联耦合关系往往导致BIT虚警;采用基于有向图的方法对BIT进行虚警分析,在系统级联图中对一种耦合关系提出同胚的概念,并给出了优化方法,给出BIT虚警分析步骤,分析报故部件的故障可信度和虚警可信度;仿真算例表明该方法可有效地应用于BIT虚警的分析。The Built--in Test （BIT） is an important technology that can greatly improve the testability and diagnosis capability of a system, however, the coupling correlation of inter-units and intra--units often cause false alarm. Analyzing BIT false alarm based on direct graph, a concept of homeomorphism is proposed for one coupling correlation in system concatenation graph and approach to optimize. Then a algorithm is given to analyze false alarm , compute fault reliability and false reliability of alarmed unit （s）. According to the given examples, the method is available in analyzing BIT false alarm.

关 键 词：有向图 BIT 虚警 关联耦合 级联图 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]