应用于工业检测的光照不均匀图像的校正  

Correction of Uneven Illuminated Image for Industrial Inspection

作　　者：杨欢[1] 

机构地区：[1]上海交通大学电子信息与电气工程学院,上海200240

出　　处：《微计算机信息》2009年第21期244-245,279,共3页Control & Automation

摘　　要：文中提出利用低通滤波的方法实现对光照不均匀图像的校正。该方法的理论依据是在对照明光场的频谱特性进行分析的基础上提出的;接着将滤波器的设计作为重点,针对参数选取问题,提出了以多次滤波逐渐逼近照明光场的方法;最后通过对实验结果的分析,证明该方法能够有效的改善不均匀光照对图像造成的影响。Low-pass filter was used to correct the uneven illumination that occurred during imaging process. The filter design was fo- cused on the parameter selection, which was considered as the most important and difficult part of the design. To solve this problem, a method of re-occurring filtering to acquire the illumination field was presented in this paper. Experiment results demonstrated that the approach achieved a satisfactory effect of removing the uneven illumination.

关 键 词：光照不均匀 低通滤波器 照明光场 

分 类 号：TP391.4[自动化与计算机技术—计算机应用技术]