FPGA查找表的电流测试方法  

LUT of FPGA Testing Method Based on Current Testing

作　　者：朱才荣[1] 

机构地区：[1]江苏省淮安信息职业技术学院,江苏淮安223003

出　　处：《仪表技术》2009年第7期41-43,共3页Instrumentation Technology

摘　　要：以Xilinx XC4000系列FPGA(Field Programmable Gate Array)器件为主要的研究对象,在详细研究FPGA内部结构的基础上,对其中的可编程逻辑模块CLB(Configrable Logic Block)的子模块LUT进行电流测试的尝试;利用SPICE软件对其进行仿真,并在此基础上建立了故障模型,对故障模型和无故障模型进行电流测试。从仿真结果可以看出两者电流的差别,说明了这种方法有一定可行性。The topic of this paper is Xilinx XC4000 series FPGA （ Field Programmable Gate Array） devices. Based on studying the internal structure of FPGA in detail, we attempt to do current test on one of sub-module of the programmable logic block CLB （Configurable Logic Block）. The SPICE simulation software is used. And based on a fault model, the simulation results of fault model and fault-free model full-speed current test can tell clearly the difference between the two currents. It shows the feasibility of this method.

关 键 词：FPGA测试 LUT 电流测试 SPICE仿真 

分 类 号：TP331.1[自动化与计算机技术—计算机系统结构]