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机构地区:[1]北京有色金属研究总院分析测试技术研究所,北京100088
出 处:《分析试验室》2009年第8期59-61,共3页Chinese Journal of Analysis Laboratory
基 金:国家科技部新技术新方法(2005JG200030)项目资助
摘 要:建立了ICP-MS法测定磁致冷材料-钆硅锗系合金中Mo、Mn、Al、V、Ni、Cu、Ga、Fe八种痕量杂质元素的方法,并对ICP-MS工作参数及条件进行了优化。方法的检出限为0.1-0.6ng/mL,测定下限为0.5~3ng/mL,回收率在95.5%~109%,相对标准偏差(n=11)为1.3%-7.6%。采用该方法对磁致冷材料.钆硅锗系合金实际样品进行了分析,结果表明精密度和准确度均满足痕量分析的要求。A new method for the determination of micro Mo, Mn, AI, V, Ni, Cu, Ga, Fe in GdSiGe series alloys as magnetic refrigeration material by ICP-MS was developed. The detection limit and minimum detectable limit of the method were 0. 1- 0.6 ng/mL and 0.5 - 3 ng/mL, respectively. The recoveries ranged from 95.5% to 109%. The relative standard deviations ( n = 11 ) of the samples were 1.3 % - 7.6 %. A sample of GdSiGe series alloys as magnetic refrigeration materials has been examined, and the results show that the method has good accuracy and precision, and it can meet the requirements of trace analysis.
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