微束微区X荧光探针分析仪在矿石微粒分析中的应用  

Apply of Micro-beam Micro-district X Fluorescent Probe Analyzer in Tiny Particles Analysis

作　　者：宋卫杰[1] 葛良全[1] 杨健[1] 张帮[1] 殷经鹏[1] 

机构地区：[1]成都理工大学核技术与自动化工程学院,成都610059

出　　处：《核电子学与探测技术》2009年第4期828-831,共4页Nuclear Electronics & Detection Technology

基　　金：中国地质调查项目;CS编号12120107605017

摘　　要：描述了一种微束微区X荧光探针分析仪,它采用会聚X光透镜来聚焦入射X射线,可对样品内微小面积的元素及其含量进行分析。以铁矿石内颗粒的测量为例,表明了微束微区X荧光探针分析仪是区分矿石中微小颗粒的有力工具,在细微材料成分分析和无损检测中具有广阔的前景。It describes a kind of Micro-beam Micro-district X fluorescent probe analyzer, which use convergence X-ray lens to focus incidence X-ray, and which can analyze the elements and their content of small area in the sample. To measure iron ore particles as an example to show the analyzer is a powerful tool for distinguish small particles of ore. And the analyzer will have a broad prospects in analysis of the subtle material composition and non-destructive testing.

关 键 词：微束微区 X荧光探针 会聚X光透镜 微小颗粒 

分 类 号：TD1[矿业工程—矿山地质测量]