X射线荧光光谱法测定钒的原子价平均值  

Determination of Average Atomic Valence of Vanadium by XRF

作　　者：孙伟莹[1] 谭秉和[1] 

机构地区：[1]北京科技大学化学系

出　　处：《岩矿测试》1998年第3期193-196,共4页Rock and Mineral Analysis

基　　金：冶金部重点科研项目

摘　　要：用Ｘ射线荧光光谱法测定了一系列钒的氧化物混合物中Ｖ的Ｋβ谱线的精细结构，研究了钒的氧化物中Ｋβ谱峰参数随混合物平均原子价变化的规律，并利用所作的定标曲线对一些实际样品，如钒渣、磁铁矿中钒的平均原子价进行了定量测定。Fine structure of vanadium K β spectrum in a series of vanadium oxide mixtures was measured by conventional XRF spectrometer. The dependence of vanadium K β parameters on average atomic valence of vanadium in its oxide mixtures was studied. By means of calibration curves established in this work, average atomic valence of vanadium in some samples, such as vanadium slag, magnetite and vanadium oxide mixtures, was analyzed quantitatively.

关 键 词：钒 X射线荧光光谱 价态分析 原子价平均值 

分 类 号：O614.511[理学—无机化学]