Electromagnetic scattering from two-layer rough interfaces in the Kirchhoff approximation  

作　　者：王蕊 郭立新 麻军 

机构地区：[1]School of Science,Xidian University

出　　处：《Chinese Physics B》2009年第8期3422-3430,共9页中国物理B（英文版）

基　　金：supported by the National Natural Science Foundation of China (Grant No 60571058);the Specialized Research Fund for the Doctoral Program of Higher Education,China (Grant No 20070701010)

摘　　要：Electromagnetic wave scattering from multilayers consisting of two two-layer Caussian rough surfaces with lossless media is investigated in the Kirchhoff approximation （KA）, with consideration of the shadowing effects. The tapered incident wave is introduced into the classic KA, and the bistatic scattering coefficient is redetermined. The advantage of this method is that it is faster in computation than the exact numerical methods. The numerical results show that the bistatic scattering coefficient calculated in the KA is in good agreement with that obtained by using the method of moment （MOM） over a most angular range, which indicates the validity of the KA proposed in our paper. Finally, the effects of the relative permittivity, the root-mean-square （RMS） height, the correlative length, and the average height between the two interfaces on the bistatic scattering coefficient are discussed in detail.Electromagnetic wave scattering from multilayers consisting of two two-layer Caussian rough surfaces with lossless media is investigated in the Kirchhoff approximation （KA）, with consideration of the shadowing effects. The tapered incident wave is introduced into the classic KA, and the bistatic scattering coefficient is redetermined. The advantage of this method is that it is faster in computation than the exact numerical methods. The numerical results show that the bistatic scattering coefficient calculated in the KA is in good agreement with that obtained by using the method of moment （MOM） over a most angular range, which indicates the validity of the KA proposed in our paper. Finally, the effects of the relative permittivity, the root-mean-square （RMS） height, the correlative length, and the average height between the two interfaces on the bistatic scattering coefficient are discussed in detail.

关 键 词：two-layer Gaussian rough surface Kirchhoff approximation tapered wave 

分 类 号：O441.4[理学—电磁学]