X光机冷轧钢板测厚仪的散射校正  

Scattering Correction of X-ray Thickness Gauge

作　　者：李立涛[1] 丛鹏[1] 

机构地区：[1]清华大学核能与新能源技术研究院,北京100084

出　　处：《原子能科学技术》2009年第8期766-768,共3页Atomic Energy Science and Technology

摘　　要：X光机测厚仪是钢厂轧钢生产线上对钢板厚度进行控制的关键设备,其测量精度要求很高,且射线的散射是影响其测量精度的重要因素。本工作根据对散射数据的测定和分析,用数学拟合的方法归纳射线散射的影响规律,根据这一规律进行散射校正,有效地消除了散射带来的偏差。X-ray thickness gauge is a key device for thickness control of the steel plate on the steel mill＇s rolling line, and high precision is demanded. X-ray＇s scattering is an important factor to affect its precision. The scattering data were measured and analyzed, and its law was concluded by method of mathematic fitting. The scattering influence is corrected according to the law and the error caused by scattering is eliminated effectively.

关 键 词：X射线 测厚仪 散射校正 

分 类 号：TL811[核科学技术—核技术及应用]