太赫兹光谱分析中用误差理论确定样品厚度的研究  

Determine sample thickness in the process of terahertz spectrum analysis using error theory

作　　者：王秀敏[1] 

机构地区：[1]北京建筑工程学院理学院,北京100044

出　　处：《激光与红外》2009年第8期884-886,共3页Laser & Infrared

摘　　要：太赫兹(1 THz=1012Hz)时域光谱作为一种新型的光谱探测技术,被广泛用来研究各种材料在远红外频谱范围内的光学特性。在太赫兹透射光谱分析中,多数情况下需要知道被测样品的厚度,才能准确提取样品的光学参数。然而,有些样品的厚度不宜测量准确甚至不能直接测量。文中介绍和讨论了利用误差理论给出了准确确定样品厚度的同时提取样品的太赫兹波段光学参数的方法,该方法可以广泛应用于该类样品的太赫兹透射谱分析过程。Terahertz （1THz = 10^12 Hz） time-domain spectroscopy as a new type of spectrum detection technology,is widely used to study a variety of materials in the far-infrared spectral range of the optical properties. In most cases,it needs to know the thickness of the sample in order to accurately extract the optical parameters of samples in THz transmission spectral analysis. However, some of the thickness of the sample can not be measured with accuracy even can not be measured directly. According to error theory, we propose a method to determine the thickness of the sample accurately,while sample＇s THz band optical parameters of method can be extracted. It can be widely used in such samples＇ THz spectrum analysis.

关 键 词：太赫兹光谱 太赫兹波段光学参数 样品厚度 误差理论 

分 类 号：O433.4[机械工程—光学工程]