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作 者:孟广耀[1] 王焕庭[1] 顾云峰[1] O.ToftSorensen
机构地区:[1]中国科技大学材料科学与工程系 [2]Riso国家实验材料部
出 处:《中国科学技术大学学报》1998年第4期421-426,共6页JUSTC
摘 要:采用商品Y2O3稳定的四方ZrO2粉体(YTZP)在低于1300℃下得到完全致密的YTZP陶瓷.微结构发育过程的SEM观察表明其致密化过程主要是由成颈生长和烧结初期形成的亚晶粒的并合过程组成.提出了三阶段烧结模型,并很好地解释了非等温烧结数据.力学性能测试表明低温(<1300℃)烧结样品具有与高温(1600℃)烧结样品相当的弯折强度.Fully sintered Y TZP ceramics were obtained at below 1300℃from commercial yttria stabilized tetragonal zirconia (TZY) powders. The microstructure development observed by SEM showed that the densification process takes place by neck growth and by coalescence of the subgrains formed at an early sintering stage. A three stage model for the sintering process is proposed to illustrate non isothermal experimental data. The bending strength measurement demonstrated that the specimens sintered at lower temperature(<1300℃)had a bend strength comparable to that of materials sintered at a high temperature(1600℃).
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