基于Multisim 10的电子电路可靠性研究  

Reliability Research of Electronic Circuit Based on Multisim 10

作　　者：雷跃[1] 谭永红[1] 

机构地区：[1]柳州铁道职业技术学院,广西柳州545007

出　　处：《计算机仿真》2009年第8期300-303,共4页Computer Simulation

摘　　要：利用Multisim 10平台进行电子电路设计的可靠性研究,可以有效地解决传统分析方法难以对电子电路设计进行容差精确分析的技术问题。方法为统计取样法,其理论基础是概率论中的大数定理,基本原理是根据指定的分布规律在器件参数容差范围内随机地选取元器件及电路工作条件参数,再经大量计算,分析出电路性能的统计规律。通过实例,说明应用Multisim 10进行蒙特卡罗分析和最坏情况分析的方法和步骤,呈现出Multisim 10在电子电路设计的可靠性研究中出色的应用效果和广阔的应用前景。Compared with the traditional method, using Muhisim 10 platform to research the reliability of electronic circuit design can effectively solve accurate tolerance analysis of the electronic circuit design. This method called statistical sampling is based on Bernoulli Theorem in Probability Theory. According to the specified distribution rule, it selects the Electron Component and work condition parameters within the tolerance randomly, then by virtue of calculation, analyzes the statistical regularity of the circuit performance. Through examples, the methods and steps of the Monte Carlo analysis and the worst case analysis by Multisim 10 are illustrated, and the outstanding effect and broad prospect of Multisim 10 in the reliability consideration of electronic circuit design are presented.

关 键 词：容差分析 仿真分析 可靠性 

分 类 号：TP391.9[自动化与计算机技术—计算机应用技术]