Wrapper扫描链均衡与系统芯片测试调度的联合优化算法  

Wrapper Scan Chain Balance and Test Scheduling Co-optimization for Core-Based System-on-chip Test

作　　者：王佳[1] 张金艺[1] 林峰[1] 江燕辉[1] 

机构地区：[1]上海大学特种光纤与光接入网省部共建重点实验室,上海200072

出　　处：《上海大学学报（自然科学版）》2009年第4期336-341,共6页Journal of Shanghai University:Natural Science Edition

基　　金：上海市科委基金资助项目(08700741000);上海市重点学科建设资助项目(J50104);上海大学创新基金资助项目

摘　　要：提出用于均衡Wrapper扫描链的交换优化算法以及用于测试调度的局部最优算法,这两种算法依据测试总线空闲率(IBPTB)指标,可从IP层和系统顶层对系统芯片(SOC)测试时间实现联合优化,进而使SOC的测试时间大大降低.为了验证两种算法及其联合优化性能的有效性和可靠性,对基于ITC’02国际SOC基准电路进行了相关的验证试验.针对p93791基准电路中core6 IP核,交换优化算法能得到比经典BFD(best fit decreasing)算法更均衡的Wrapper扫描链,在最佳情况下最长Wrapper扫描链长度减少2.6%;针对d695基准电路,局部最优算法根据IP核的IBPTB指标,可使相应SOC的测试时间在最优时比经典整数线性规划(ILP)算法减少12.7%.A new wrapper scan chain balance algorithm called exchange optimization and a new test scheduling method called local optimization are presented in this paper. These two algorithms collaborate on the IP level and top level according to idle bit percentage on test bus （IBFFB） so as to greatly reduce system-on-chip （SOC） test time. To demonstrate the practicality and validity of both algorithms and their cooperation performance, ITC＇02 soc benchmark circuits are used as the experiment objects. The result on core6 in p93791 shows that exchange optimization can achieve more balanced wrapper scan chains than the classic algorithm of best fit decreasing （BFD） by up to 2.6%. The result on d695 shows that the total test time achieved by local optimization according to IBPTB can be up to 12.7% lower than that by the classic integer linear programming （ILP） algorithm.

关 键 词：Wrapper扫描链均衡 测试调度 联合优化 

分 类 号：TN407[电子电信—微电子学与固体电子学]