基于EPA的光栅位移测量系统  

Grating Displacement Measurement System Based on EPA

作　　者：杨辉[1] 李浩锋 罗正伟[3] 

机构地区：[1]南昌大学 [2]东方电机有限公司 [3]西安理工大学

出　　处：《单片机与嵌入式系统应用》2009年第9期51-54,共4页Microcontrollers & Embedded Systems

摘　　要：在介绍高速单片机DS80C410内部结构及其工作原理和光栅位移测量基本原理的基础上,给出一种基于EPA的光栅位移测量系统的设计方案,并对该方案进行硬件和软件方面的实现。针对光栅位移测量系统长期使用过程中易出现的问题,给出提高测量精度的措施。调试结果证实,本系统有较好的测试性能,能满足精密位移测量及定位的需要。High-speed Microcontroller DS80C410 internal structure and its working principle as well as the basic principles of grating displacement measurement are introduced. A design of measurement system with grating displacement sensor based on EPA is brought forward, both hardware and software designs are realized. In order to solve frequently occurring system problems in the long -term, several methods are given to improve measurement accuracy. Test result shows that the system has good measurement performance, satisfies the needs of precision displacement measuring and positioning.

关 键 词：DS80C410 光栅位移传感器 位移测量 工业以太网 LXT972ALC 

分 类 号：TH822[机械工程—仪器科学与技术]