扫描探针显微镜外接扩展I/V装置的设计与实践  

The design and practice of I/V measuring device attached to SPM

作　　者：崔玉明[1] 孟中[2] 

机构地区：[1]吉林大学化学学院,吉林长春130012 [2]中国科学院长春光学精密机械与物理研究所航测部,吉林长春130031

出　　处：《实验技术与管理》2009年第7期61-63,共3页Experimental Technology and Management

摘　　要：近些年来,各种功能材料纳米区域的伏安特性得到越来越多的关注,并已有大量相关研究成果发布。这些科研的实验工作大多由扫描探针显微镜来完成,然而商用仪器的技术指标固定,提供的直流电压和电流的测量范围有限。通过对日本精工SPA-400扫描探针显微镜的I/V装置进行基于单片机系统的扩展二次开发,结合自行开发的软件包,大大提高了原系统的I/V测量范围,可适合多种晶体样本的测量。该设计避免了重新投入造成的成本浪费,值得推广采用。In recent years,the I/V characteristics of different functional materials are much concerned and many relative research harvests are obtained.Usually,most of the experimental work is done by SPM.However,due to the fixed technical index of commercial instrument,the measuring range of DC voltage and current is comparatively limited.By designing new I/V device of some types of SPM based on single chip system and applying compatible software developed by us,the range of original I/V measuring is extended pratically.Thus,this designing method makes it possible for all kinds of crystal samples to measure and research.Besides,it can avoid investing much capital in buying new type of SPM,which is worthy of reference and adoption.

关 键 词：扫描探针显微镜 伏安特性 测量装置 

分 类 号：TN16[电子电信—物理电子学] TM930[电气工程—电力电子与电力传动]