一种新型大场纵向表面磁光克尔效应测量系统  

A New Measurement System of Longitudinal Surface Magneto-Optic Kerr Effect in Large Magnetic Field

作　　者：顾培培[1] 马斌[1] 张宗芝[1] 金庆原[1] 

机构地区：[1]复旦大学光科学与工程系,上海200433

出　　处：《复旦学报（自然科学版）》2009年第4期485-492,共8页Journal of Fudan University：Natural Science

基　　金：国家自然科学基金资助项目(60490290)

摘　　要：基于磁光克尔效应的测量技术已发展成为研究表面磁性的一种有效手段,它具有高精度、响应快、低成本等优点.介绍了一种新型大场纵向表面磁光克尔效应测量系统,通过使用聚焦透镜来有效增大入射激光的入射角,提高纵向克尔信号强度,减小磁极间距,实现了测量具有较大面内矫顽力的样品;同时通过引入分光路系统来克服由于激光器光强变化所导致的信号不稳问题.该系统测量精度较高,可以满足磁性薄膜及超薄膜的面内磁滞回线测量.Magneto-optic Kerr technique has been a powerful tool to deeply investigate the surface magnetics due to its some advantages such as high accuracy, fast response and low cost, et al. A new measurement system of longitudinal surface magneto-optic Kerr effect in large magnetic field is introduced. By increasing the incidence angle of laser beam with a convex lens, improving the intensity of Kerr signal, as well as decreasing the spacing between magnetic poles, we are able to measure the samples with large coercivity in plane. Meanwhile, the incident laser beam is divided into 2 beams in order to solve the instability problem of laser. With the high accuracy, this system can be used in the measurement of thin and ultra-thin magnetic films.

关 键 词：磁光克尔效应 法拉第效应 磁滞回线 

分 类 号：O436.4[机械工程—光学工程]