对数正态分布恒加寿命试验在带有随机移走的定时截尾模型下的优化设计  

The optimal design of accelerated life tests for lognormal distribution under type-Ⅰ interval censoring with progressively random removals

作　　者：樊爱霞[1] 杨春燕[1] 

机构地区：[1]云南大学数学与统计学院,云南昆明650091

出　　处：《云南大学学报（自然科学版）》2009年第5期444-448,454,共6页Journal of Yunnan University(Natural Sciences Edition)

基　　金：国家教育部留学回国人员科研启动基金资助

摘　　要：研究了恒加寿命试验的优化设计.试验中采用间隔观测模式,并假定随机移走的产品数服从二项分布.最优方案分别考虑了2个和3个加速应力水平,对低加速应力水平和试验产品在各应力水平下的分配比例进行优化,使得正常应力水平下产品寿命分布估计量的渐近方差达到最小.3个应力水平的试验可以为检验寿命参数与应力水平之间的关系提供依据,降低推断的风险.最后通过数值模拟方法对一些参数值给出了最优方案,最优方案的确定和实施十分方便,因而有广泛的使用空间和应用价值.Optimal accelerated life test （ALT） plans are investigated under progressive type I interval censoring with random removals when lifetimes are lognormal distributed. The practical optimal ALT plans which minimize the asymptotic variance of the estimated qth quantile for different combinations of total number of inspections and removal probability are determined based on the ideas of equally spaced （ES） or equal probability （EP） scheme with both two and three stress levels. Numerical results are presented. Some suggestions are given to experimenters for selecting an appropriate practical plan in designing an ALT under the proposed censoring scheme.

关 键 词：恒加寿命试验 定时截尾模型 随机移走 对数正态分布 极大似然估计 渐近方差 

分 类 号：O213[理学—概率论与数理统计]