TEM纳米尺度石墨标样的制备  

Preparation of Graphite Standard for TEM Calibration in Nano-scale

作　　者：娄艳芝[1] 柳得橹[2] 

机构地区：[1]北京航空材料研究院,北京100095 [2]北京科技大学材料科学与工程学院,北京100083

出　　处：《现代科学仪器》2009年第4期131-133,共3页Modern Scientific Instruments

摘　　要：透射电镜的长度标尺或公称放大倍数是判断试样中组织细节尺寸的依据,需要应用纳米级长度标样进行校准。本文介绍了一种用石墨制备透射电镜专用纳米尺度标样的方法,对石墨的X射线衍射分析以及对石墨标样的TEM高分辨像和电子衍射分析表明,标样中石墨的高分辨像为(002)晶面的点阵像,其晶面间距为0.342 nm,可作为纳米尺度的参照材料。本文对使用纳米尺度标样校正TEM标尺的基本方法进行了简要讨论。The scale bar and/or nominal magnification on TEM is usually used as a criterion to estimate the dimension of the specimen feature. They need to be calibrated by standard specimen in nanometer scale. This paper describes briefly a method for preparation of graphite standard for magnification calibration in TEM high resolution electron microscopy （HREM）, selected area electron diffraction （SAED） and X-ray diffraction（XRD） were used to determine the lattice parameters of the graphite standard. Lattice image of （002） plane from the graphite with interplanar spacing 0.342 nm was used for calibration of the scale bar on the images. Method using the standard specimen in nanometer scale to calibrate the scale bar and magnification of TEM is also discussed in the present study.

关 键 词：TEM放大校准 纳米长度标样 石墨晶体 

分 类 号：TB383.1[一般工业技术—材料科学与工程]