On Stabilizing Sets of PI Controllers for Multiple Time Delayed Process  

On Stabilizing Sets of PI Controllers for Multiple Time Delayed Process

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作  者:郑达 任正云 方建安 

机构地区:[1]College of Information Science and Technology,Donghua University

出  处:《Journal of Donghua University(English Edition)》2009年第1期36-39,共4页东华大学学报(英文版)

基  金:National Natural Science Foundation of China (No.60674088)

摘  要:This paper considers the problem of stabilizing multiple time delayed processes using proportional integral(PI) controller.The presented approach is based on finding all possible values of control parameters which will result in pure imaginary roots of closed loop characteristic equation under all process parameters fixed.The ergodic search of three PI control parameters are converted from the range of infinity to finite range by introducing trigonometric tangent function.After all possible stability boundaries are obtained,the Nyquist stability method is used to determine the actual stability region of the controller parameters.This method also permits design for simultaneous minimum gain and phase margin requirement.An illustrative example case is also presented.This paper considers the problem of stabilizing multiple time delayed processes using proportional integral(PI) controller.The presented approach is based on finding all possible values of control parameters which will result in pure imaginary roots of closed loop characteristic equation under all process parameters fixed.The ergodic search of three PI control parameters are converted from the range of infinity to finite range by introducing trigonometric tangent function.After all possible stability boundaries are obtained,the Nyquist stability method is used to determine the actual stability region of the controller parameters.This method also permits design for simultaneous minimum gain and phase margin requirement.An illustrative example case is also presented.

关 键 词:proportional-integral controller multiple timedelay robust stability stability region 

分 类 号:TP273[自动化与计算机技术—检测技术与自动化装置] O175.13[自动化与计算机技术—控制科学与工程]

 

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