多应力加速模型及加速系数研究  

Study of Accelerated Model and Accelerated Factor Under Multiple-stress

作　　者：康劲松[1] 景诗毅[1] 张烨[1] 徐国卿[1] 

机构地区：[1]同济大学电气工程系,上海201804

出　　处：《机电一体化》2009年第8期32-34,37,共4页Mechatronics

基　　金：国家863子课题(2007AA11A105)资助

摘　　要：介绍了可靠性及加速寿命试验的重要性,概述了国内外可靠性加速寿命试验(ALT)及加速模型的研究情况。鉴于电子产品最常见的两种应力分别是温度和电应力,对应的加速模型分别是阿伦尼斯和逆幂率模型,文章在分析驱动电机系统中直流母线电容单一加速模型及加速系数的基础上,推导出直流母线电容在温度-电应力同时作用下的加速模型和加速系数。This paper introduces the importance of the reliability and accelerated life testing （ALT）,and summarizes the researches on ALT and accelerated models. For electronic products,the temperature and electric-stress are commonly be used in ALT. Their models are Arrhenius model and inverse power model. It presents the accelerated model and accelerated factor for DC bus capacitance in drive motor system under multiple-stress models （temperature and electric-stress ）based on analyzing the single stress models.

关 键 词：加速寿命试验 加速模型 加速系数 多应力 

分 类 号：TB114.3[理学—概率论与数理统计] TN406[理学—数学]