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作 者:黄樟平[1] 张亚辉[2] 陈刚 邹天熬 曾德长[1]
机构地区:[1]华南理工大学材料科学与工程学院,广东广州510640 [2]武汉理工大学资源与环境工程学院,湖北武汉430070 [3]广东怀集汽车配件制造有限责任公司,广东肇庆526400
出 处:《电镀与环保》2009年第5期12-15,共4页Electroplating & Pollution Control
摘 要:采用硫酸盐镀液在铜基体上电沉积Sn-Bi镀层,利用能谱仪(EDS)、扫描电子显微镜(SEM)和X射线衍射仪(XRD)研究了电沉积参数对镀层成分和微观结构的影响。结果表明:镀层中Sn的质量分数随着镀液中Sn的质量浓度的增大而增大,同时随着电流密度的增大,Sn的质量分数不断减少;Sn-Bi镀层主要由四方晶系的Sn和菱形晶系的Bi组成;另外,研究发现电流密度对镀层形貌影响较大。Sn-Bi films were electrodeposited on Cu substrate from a sulphate bath. The effects of plating parameters on the composition and microstructure of electrodeposits were investigated by means of energy dispersive X-ray spectroscopy (EDS), scanning electron microscope (SEM) and X-ray diffraction (XRD). The results show that the mass fraction of Sn in deposit increases with the increasing of SnSO4 concentration in the bath, but continuously decreases with the increasing of current density. XRD patterns show that the Sn-Bi films mainly consist of tetragonal phase tin and rhombohedral phase bismuth. In addition, it is found that the impact of current density on the morphology of deposited Sn-Bi films is more remarkable.
分 类 号:TQ153[化学工程—电化学工业]
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