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作 者:LIAO Yan-Hua DONG Zheng-Chao LIANG Zhi-Peng YIN Zai-Feng
机构地区:[1]School of Mathematics and Physics, Huangshi Institute of Technology, Huangshi 435100, China [2]School of Science, Nantong University, Nantong 226000, China [3]Department of Physics, Suzhou University, Suzhou 215006, China [4]Department of Physics, College of Science, Yanbian University, Yanji 133002, China
出 处:《Communications in Theoretical Physics》2009年第10期715-720,共6页理论物理通讯(英文版)
基 金:Supported by the"333"Project Funds of Jiangsu Province of China,the National Natural Science Foundation of China under Grant No.20571029;by the Program for Excellent Talents in Huangshi Institute of Technology
摘 要:We study the temperature T and the phase of the Josephson critical current I(Ф) by taking into account the roughness scattering effect at inerface in an f-wave superconductor (S)/Insulator layer (I)/f-wave superconductor (S) junction. It is found that the Josephson critical currents in f-wave Sir-wave S, the barrier strength and the roughness strength at inerface always suppress the Andreev reflection. When α=β, the phase dependence of the Josephson current I(Ф) between two f-wave S is predicted to be sin Ф; particularly, when a α≠ β, the phase dependence of the Josephson current I(Ф) between two f-wave superconductors is not predicted to be sin Ф and with the barrier strength increasing, the period of the I(Ф) turns decrease.
关 键 词:f-wave S/f-wave S junction f-wave superconductor (f S) Josephson current
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