双极运算放大器低剂量率辐照损伤增强效应的变温加速辐照方法  

Accelerated Simulation Method to Evaluate Enhanced Low Dose Rate Sensitivity of Bipolar Operational Amplifiers by Decreasing Temperature in Step During Irradiation

作　　者：陆妩[1] 任迪远[1] 郑玉展[1,2] 王义元[1,2] 郭旗[1] 余学峰[1] 

机构地区：[1]中国科学院新疆理化技术研究所,新疆乌鲁木齐830011 [2]中国科学院研究生院,北京100049

出　　处：《原子能科学技术》2009年第9期769-775,共7页Atomic Energy Science and Technology

摘　　要：介绍了一种变温辐照加速评估双极电路低剂量率辐照损伤增强效应的新实验方法,并对各种实验现象的潜在机理进行了分析。结果显示,阶跃降低辐照温度的变温辐照法,不仅能较好地模拟双极运放电路实际空间低剂量率的辐照损伤,且比美军标的恒高温辐照法的总剂量评估范围明显增大,还可作为快速鉴别器件是否具有低剂量率辐照损伤增强效应的有效实验方法。A new experimental method was introduced to evaluate enhanced low dose rate sensitivity by decreasing temperature in step during irradiation,and the mechanisms of the experimental phenomena were analyzed.It shows that this new method can perfectly simulate low dose rate damage of bipolar operational amplifiers in real environment,and obviously extend the evaluation total dose of elevated temperature irradiation method proposed in MIL-STD-883G.Meanwhile,the method can also be an efficient way to quickly determine the enhanced low dose rate sensitivity of bipolar circuits.

关 键 词：双极运算放大器 60Coγ辐照 低剂量率辐照损伤增强效应 加速评估方法 

分 类 号：TN322.8[电子电信—物理电子学] TN431