光栅光谱仪探测本领的综合分析  

The Comprehensive Analysis to Resolving Ability of WDS-8A Grating Spectrometer

作　　者：张玲[1] 王堃[2] 梁士利[2] 

机构地区：[1]长春理工大学理学院,长春130022 [2]东北师范大学物理学院,长春130024

出　　处：《长春理工大学学报（自然科学版）》2009年第3期362-365,共4页Journal of Changchun University of Science and Technology(Natural Science Edition)

基　　金：吉林省环保局科技项目资助(吉环科字第2008-23号)

摘　　要：以光电倍增管为探测器,分析了WDS-8A光栅光谱仪入射狭缝和出射狭缝的宽度、高压以及其它一些因素对测量结果的影响。实验发现:入射狭缝和出射狭缝宽度的减少会增加谱线的分辨率,但如果宽度小于0.03mm,将无法观测到结果;高压对分辨率没有明显影响,但可以改善观察的结果。Using photomultiplier tube as a detector,we have analyzed the impact of the incident slit width and exit slit wid-th,high pressure and other factors on the measuring results of grating spectrometer.Conclusion： If the incident slit and exit slit width reduce,the resolution of spectral lines will increase,but when the width less than 0.03mm,the results won t be observed;high pressure which can improve the results of observation has no effect on the resolution.

关 键 词：光栅光谱仪 狭缝宽度 分辨本领 

分 类 号：O433.4[机械工程—光学工程]