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机构地区:[1]电子科技大学,成都610054 [2]中国科学院光电技术研究所,成都610209
出 处:《光电工程》2009年第10期60-64,共5页Opto-Electronic Engineering
摘 要:根据光腔衰荡(CRD)原理开展了高反镜反射率测量技术的研究。采用基于半导体激光器自混合效应的连续光腔衰荡技术(SM-CRD)测量高反射率腔镜,不但简化了CRD技术应用的结构装置,同时也大大提高了入射光与衰荡腔之间的耦合效率。给出了半导体激光器由于自混合效应引起的频谱变化,分析了反馈光强度对半导体激光器输出特性的影响。使用反射率为99.914%的腔镜建立了1064nm高反射率测量装置,测量精度达到10-5量级。实验结果表明,使用该装置测量腔镜的反射率,不但大大降低了系统的成本,而且有利于提高系统的测量精度和稳定性。By employing a continuous-wave broadband diode laser, a Self-mixing Cavity Ring-down (SM-CRD) technique is investigated for accurate reflectivity measurement of, optical mirrors at 1064nm. The self-mixing effect is induced from the optical feedback, directly reflected from the Ring-down Cavity (RDC), is re-injected into the oscillator cavity of the diode laser. The influence of the self-mixing effect on both output power and spectrum of the diode laser is presented. The coupling efficiency of the laser power into the RDC is greatly enhanced by the self-mixing effect. In the SM-CRD experimental setup, the high reflectivity of the cavity mirrors is measured to be 99.914% and the measurement accuracy is at the 10.5 level. The experimental results demonstrate that the SM-CRD technique is a very simple, inexpensive, precise and stable for high reflectivity measurement.
分 类 号:TN247[电子电信—物理电子学]
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