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作 者:胡古今[1] 张婷[1] 孙璟兰[1] 朱大明 褚君浩[1] 戴宁[1]
机构地区:[1]中国科学院上海技术物理研究所红外物理国家重点实验室,上海200083 [2]密苏里-堪萨斯城市大学物理系,美国堪萨斯64110
出 处:《红外与毫米波学报》2009年第5期321-324,329,共5页Journal of Infrared and Millimeter Waves
基 金:Supported by National Natural Science Foundation of China (Grants No.60578058, 10774154 and 60221502);Knowledge Innovation Program of Chinese Academy of Sciences;Shanghai City Committee of Science and Technology in China (Grants No.08JC1420900 and 0452nm085)
摘 要:研究了由致密PbZr0.38Ti0.62O3和多孔PbZr0.38Ti0.62O3膜层交替排列组成的多层膜在温度为420K时的介电行为.在102~106Hz的频率范围,观测到两种截然不同的介电驰豫.位于低频区的介电损耗峰归因于空间电荷极化.通过俄歇电子谱和电子顺磁共振谱分析,初步判定遵从Arrhenius律、热激活能为0.49eV的高频介电驰豫则起源于氧空位V¨0和Ti3+形成的极性缺陷复合体V¨0-Ti3+对交变电场的响应.Dielectric behavior of PbZr0.38Ti0.62O3 multilayer with alternating dense and porous PbZr0.38Ti0.62O3 layers was investigated at 420K. Two distinct dielectric relaxation processes were observed in the frequency range from 102 Hz to 106 Hz. The relaxation at lower frequencies is attributed to the space charge polarization. The one at higher frequencies,with a thermal activation energy of 0.49 eV,might originate from the response of singly positive charged defect dipoles V¨0 -Ti^3+ to ac electric fields. These dipoles are formed by the doubly ionized oxygen vacancies V0 and trivalent titanium ions Ti3+ as indicated by the results of Auger electron spectrum and electron paramagnetic resonance spectrum.
关 键 词:PbZr0.38Ti0.62O3多层膜 极性缺陷复合体 介电驰豫
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