高过载下电子元器件测试方法研究  

Research on Text Methods of Electronic Elements under High Overload

作　　者：黄运銮[1] 李波[1] 张亚[1] 徐建军[1] 顾强[1] 

机构地区：[1]中北大学机电工程学院,太原030051

出　　处：《弹箭与制导学报》2009年第5期221-223,226,共4页Journal of Projectiles,Rockets,Missiles and Guidance

基　　金：教育部科学技术研究重点基金(208024);山西省自然科学基金(2007011054)资助

摘　　要：高过载测试电路必须满足高速测试的特点,文中对电阻、电容、电感及二极管等电子元器件的特征参数测试的方法进行了分析,在电子元器件的高过载实验中,设计出了相应的测试电路。通过实验验证了这些测试电路能达到预期的要求,为引信系统在高过载条件下的可靠性分析打下了坚实的基础。High overload testing circuit should be featured with high speed testing character. The testing methods of characteristic parameters of electronic elements such as resistance, capacitance, inductance and diode were proposed. In high-overload experiments of those electronic elements, corresponding testing circuits were designed, which proved by experiments will meet the expected requirements and lays solid foundation for reliability analysis of fuse system under the condition of high overload.

关 键 词：特征参数 测试电路 可靠性 高过载 

分 类 号：TN707[电子电信—电路与系统]