基于线阵CCD扫描的测量技术  

Measurement Technology Based on Linear Array CCD Scanning

作　　者：王泽民[1] 高俊钗[1] 左乾县 

机构地区：[1]西安工业大学电子信息工程学院,陕西西安710032 [2]兵器工业第202所,陕西咸阳712035

出　　处：《山西电子技术》2009年第5期36-38,共3页Shanxi Electronic Technology

摘　　要：针对零件二维几何尺寸的高精度非接触测量问题,提出了基于线阵CCD扫描测量的方法。通过对扫描同步的分析,很好地控制了扫描图像的失真。对CCD扫描图像设计了处理算法。由于需布置光源,而光源随时间会有所衰减,所以对图像采用边缘检测的算法,以减小光源亮度变化对图像测量的影响;由于获取的梯度是梯度带,同时为了不加剧边缘的不连续性,采用了细化算法。对间断点进行插值,采用周长法计算直径,系统测量结果与采用千分尺进行测量的结果相比较,其测量误差不大于10μm。A linear array CCD scanning measurement method is proposed for high-precision non-contact measurement of the two-dimensional geometry; through the analysis of synchronization scanning, it has a very good control for the scanned image distortion. A processing algorithm is designed. Because of the light arranged that will be attenuated over time, the edge detection algorithm is used to reduce the impact that from the light changing. For the gradient zone, in order to not to aggravate the edge discontinuities, the thinning algorithm is used. Comparing the system measurement results with the result by micrometer, the measurement error is less than 10 μm.

关 键 词：线阵CCD 测量系统 扫描同步控制 图像处理 二维尺寸 

分 类 号：TP274.5[自动化与计算机技术—检测技术与自动化装置]