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出 处:《分析试验室》2009年第11期91-96,共6页Chinese Journal of Analysis Laboratory
基 金:北京有色金属研究总院青年基金资助
摘 要:研究了不需基体分离,膜去溶-ICP-MS法直接测定高纯Eu2O3中的14种痕量稀土杂质的分析方法。讨论了Eu基体产生的多原子离子对被测元素的质谱干扰。使用膜去溶后,待测元素灵敏度提高3倍左右,EuO/Eu产率从去溶前的0.016%降低为0.0007%。建立了Tm的数学校正方程,通过膜去溶结合数学校正可将Eu基体对Tm干扰完全消除。14种稀土杂质的检出限和(∑RE)为70 ng/L,测定下限和(∑RE)为0.54μg/g。对6N高纯Eu2O3样品进行了分析,样品回收率为96%-109%,RSD小于10%。所建立的方法对Eu2O3标准样品的测定结果与国家标准方法测定结果相一致。A method for the direct determination of 14 trace rare earth impurities in high purity Eu2O3, without Eu matrix separation, by inductively coupled plasma mass spectrometry with membrane desolvation (MD-ICP-MS) was developed. The mass spectra isobaric interferences of polyatomic ions from Eu matrix to the analytes were discussed. By utilizing membrane desolvation, the sensitivity of the analytes was incre.ased by 3 times approximately and the production ratio of EuO/Eu was reduced from 0.016% to 0.0007%. The algebraic correction equation of Tm was developed. Combining membrane desolvation with algebraic correction equations, the polyatomic ion interferences from Eu matrx to Tm were eliminated completely. The total detection limit and determination limit for 14 rare earth impurities were 70 ng/L and 0.54 μg/g, respectively. Recoveries of spiked 6N high-purity Eu2O3 sample for 14 rare earth impurities were 96% - 109%. The determined results of the standard sample were in good agreement with the reference value.
关 键 词:高纯Eu2O3 膜去溶 数学校正 ICP-MS 多原子离子干扰
分 类 号:O557.6[理学—热学与物质分子运动论]
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