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作 者:沈少伟[1] 颜树华[1] 周春雷[1] 李锷[1] 童慧鹏[1]
机构地区:[1]国防科技大学机电工程与自动化学院,长沙410073
出 处:《半导体光电》2009年第5期770-773,共4页Semiconductor Optoelectronics
摘 要:颗粒在工业和科学研究中涉及的领域非常广泛,常用的颗粒粒度及其分布的测试方法中,激光散射法具有测试精度高、测量速度快、重复性好、可测粒径范围宽等突出优点。为提高测量精度,通过对无模式反演算法的研究,提出了一种改进的独立模式粒度反演算法,并设计了光学系统和环形光电探测器,开发了粒度测试分析软件,实现了基于散射原理的激光粒度测试系统。实验结果表明,所提出的算法有效地提高了测量精度,降低了测量的重复误差。Particle is widely involved in scientific research and industry. Among the frequently used examination method for particle size and distribution, the laser scattering owns especial advantages such as high precision, high speed, good repeatability and wide measuring range. For enhancing the measuring accuracy, an amelionated non-mode inversion algorithm is presented based on the study of non-mode data processing algorithm, optical system and annular photodiodes are designed, and corresponding testing and analyzing softwares are developed, realizing a laser particle size analysing system based on scattering theory. The experimental results indicate that this algorithm enhances the measuring precision and reduces the repetition error effectively.
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