基于层析法的三维断层反求测量技术研究  

Research on Reverse Measurement of 3D Layer Data Based on Cross-Section Scanning Measurement

作　　者：牟宗魁[1,2] 唐克伦[1,2] 王文哲[1,2] 郑彬[1,2] 

机构地区：[1]四川理工学院机械工程学院,四川自贡643000 [2]四川省高校过程装备与控制工程重点实验室,四川自贡643000

出　　处：《四川理工学院学报（自然科学版）》2009年第5期104-107,115,共5页Journal of Sichuan University of Science & Engineering(Natural Science Edition)

摘　　要：总结国内外关于三维断层反求测量技术,对各种方法及原理进行阐述。针对层析法在测量领域的应用特点,介绍了几种层析反求测量设备,比较出各自的优缺点,指出了目前层析设备中存在的不足,并提出了今后工作的重点研究方向。Having summarized the technology of reverse measurement based on 3D layer data both home and abroad, varies methods and principles are expatiated. This paper focuses on the applications of cross-section scanning measurement in the field, and introduces some devices of cross-section scanning measurement in reverse engineering. The advantages and disadvantages of each device are analyzed, and the problems in the research of devices are pointed out. Then emphases on the further research and working direction are proposed.

关 键 词：层析 断层数据 反求工程 精度 

分 类 号：TH741.1[机械工程—光学工程] TP391.7[机械工程—仪器科学与技术]