高温超导薄膜微波表面电阻多频点无损测试  

Nondestructive measurement of microwave surface resistance of HTS at multifrequency

作　　者：曾成[1] 罗正祥[1] 邹雄飞[1] 补世荣[1] 羊恺[2] 

机构地区：[1]电子科技大学光电信息学院,成都610054 [2]电子科技大学空天科学与技术研究院,成都610054

出　　处：《仪器仪表学报》2009年第10期2150-2154,共5页Chinese Journal of Scientific Instrument

摘　　要：根据镜像兰宝石谐振器法原理,设计并制作了一个双模工作的兰宝石介质谐振器。该谐振器利用兰宝石柱中TE011和TE012两个工作模式,在一个温度循环内实现了对高温超导薄膜在不同频点下微波表面电阻值的无损测试。同时,介绍了配对兰宝石的选择方法,并对已知微波表面电阻待测样品进行了改进,以确保镜像兰宝石谐振器法中A、B值准确性。与其他测试方法的谐振器相比,该谐振器具有单片、无损、多频点测试的优点,且其测试步骤也极为简单。A sapphire resonator with two working modes is designed based on the method of image sapphire resonator.TE011 and TE012 modes of this resonator are used for the measurement simultaneously.Nondestructive measurement of microwave surface resistance for high temperature superconductor thin film in one temperature cycle is realized with this resonator.In order to improve the accuracy of the values of A and B,a method for choosing matching sapphire rods is introduced and the sample with known microwave surface resistance is im-proved.This resonator is characterized by its single piece,nondestructive feature and multifrequency measure-ment and the measurement procedure is quite easy.

关 键 词：高温超导薄膜 微波表面电阻测试 多频点 

分 类 号：TM93[电气工程—电力电子与电力传动]