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作 者:吉争鸣[1] 许伟伟[1] 金飚兵[1] 曹春海[1] 张静[1] 刘天飞[1] 范翠[1] 郭大元[1] 吴培亨[1]
机构地区:[1]南京大学,江苏南京210093
出 处:《稀有金属材料与工程》2008年第A04期493-496,共4页Rare Metal Materials and Engineering
基 金:国家"863"项目(2006AA03Z214);国家"973"项目(2007CB310404);国家自然科学基金项目(60571007)资助
摘 要:高温超导薄膜在电子学的许多领域,特别是在电信领域,微波无源器件等方面有着广泛的应用。例如超导滤波器,正在发展之中,并且已经进入实际应用阶段。在超导微波器件的设计方面,如超导微波器件的设计,超导薄膜的微波表面电阻是应用的一个重要参数。由于高温超导薄膜的特殊机械特性,因此发展了各种各样的测量高温超导薄膜表面电阻的方法,各有其优点。每一种测量方法都对超导薄膜的面积大小有要求,而真正起作用的有效面积可能只是一部分。本文讨论分析了国际标准测量方法IEC/TC90的超导薄膜的实际有效面积。按照高温超导薄膜表面电阻测量国际标准方案,实际制作了用于测量面积分别为2英寸(5.08cm),3英寸(7.62cm)的高温超导薄膜微波表面电阻的谐振腔,并测量了表面电阻。对测量结果作了分析比较。并探讨了用于大面积的超导薄膜的微波表面电阻测量的可行方法。给出了设计介质谐振腔的简单方法,以适应不同测量的需要。In various fields of electronics, especially in telecommunication fields, microwave passive devices such as filters using high Tc superconductor (HTS) thin films are being developed and are undergoing on-site testing. Superconductor materials for applications of microwave resonators, filters, antenna and delay lines have the advantage of very low loss characteristics. Knowledge of this parameter is of primary importance for the development of a new material. For the typical reason of mechanics, various characterization technique have been developed to measure these properties, and each has its own advantages. For individual method, has some requires for the films, such as the dimension of the specimen under test. Sometime the really effective area is only a part of the whole area. In this article, we discussed the practical utilized area of a specimen of international standard on electronic characteristic measurements-surface resistance of superconductors at microwave frequencies. We designed the measurement apparatus for RS and measured the specimens. Both 2 inch specimen and 3 inch specimen are measured. We discussed the insertion loss for different diameter specimens. Some methods of measurements-surface resistance for different diameter specimens have been suggested. Also, we suggested the design procedures of dielectric resonator for the purpose of measuring high Tc superconductor (HTS) thin films surface resistance in different size samples.
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