温度对TFA-MOD制备YBCO薄膜的影响  

Effect of Temperature on YBCO Films Fabricated by TFA-MOD Method

作　　者：金利华[1] 卢亚锋[1] 熊晓梅[1] 刘奉生[1] 于泽铭[1] 白利锋[1] 李成山[1] 

机构地区：[1]西北有色金属研究院,陕西西安710016

出　　处：《稀有金属材料与工程》2008年第A04期576-579,共4页Rare Metal Materials and Engineering

摘　　要：采用TFA-MOD方法在YSZ单晶基底上制备YBCO薄膜,主要研究高温热处理阶段温度对薄膜微结构和超导电性的影响。采用X射线衍射和扫描电镜分别对相组成与形貌进行分析。结果显示在800～830℃之间,能够获得纯的YBCO相,同时随着晶化温度的降低,薄膜面内a轴晶粒减少,有利于薄膜超导电性的改善。YBa2Cu3O7-x（YBCO） films on YSZ single crystal have been fabricated by the metalorganic deposition method using trifluoroacetates （TFA-MOD）, and the effect of firing temperature on the microstructure and critical properties were evaluated. The phase formation and microstructure were characterized by X-ray diffraction and scanning electron microscopy （SEM）. The pure YBCO phase could be formed in the temperature range of 800～830 ℃, and the film had lower a axis grain content with decreasing firing temperature which could be attributed to the improved critical properties.

关 键 词：TFA-MOD YBCO 超导 

分 类 号：TM26[一般工业技术—材料科学与工程]