铝、硅质耐火材料的X射线荧光光谱分析  

Determination of Al-Si Refractories by X-Ray Fluoresence Spectrometry

作　　者：阚斌[1] 赵惠君[1] 李良骅 

机构地区：[1]马钢股份有限公司钢研所

出　　处：《冶金分析》1998年第5期35-38,共4页Metallurgical Analysis

摘　　要：采用Ｘ射线荧光光谱仪测定铝、硅质耐火材料，研究了系统制样方法及基体吸收－增强效应的校正，还研究了测定精度及制样精度，拓展了铝、硅质耐火材料的分析范围。A method for determination of Al-Si refractories by X-ray fluoresence spectrometry is described in this paper.Aseries of sampling methods and correction of metrix absorb-strength effect are studied.Also,determination precision and sampling precision are studied.Analytical range is wided.

关 键 词：X射线荧光光谱 耐火材料 硅 铝 

分 类 号：TQ175.5[化学工程—硅酸盐工业]