从变形光栅条纹提取基准光栅信息  

Extract Original Grating Information from Deformed Grating Pattern

作　　者：杨初平[1] 翁嘉文[1] 赵静[1] 杨意[1] 

机构地区：[1]华南农业大学物理系,广东广州510642

出　　处：《光学学报》2009年第11期3078-3081,共4页Acta Optica Sinica

基　　金：广东省自然科学基金(9151064201000035);华南农业大学校长基金(4900-k07281)资助项目

摘　　要：基于傅里叶变换轮廓术,提出一种直接从变形光栅条纹中提取基准光栅条纹信息并重建基准光栅的测量方法。分析了基准光栅条纹和参考平面的功能,揭示变形光栅条纹和基准光栅条纹的关系;应用窗口傅里叶变换对变形光栅条纹中的各个微小区域进行频谱分析,从中识别并提取基准光栅的频率和相位信息;重构出一幅完整的基准光栅条纹,实现三维物体形貌测量。实验结果表明该方法是可行的,为三维形貌测量提供一种新手段。Based on fourier transform profilometry（FTP）, a new method is proposed for extracting the fundamental frequency information of the original grating pattern from its deformed grating pattern and.reconstructing the original grating pattern. Firstly, the functions of original grating pattern and reference plane are described, and the relation between original grating pattern and its deformed grating pattern is revealed. Then the spectrum distribution of the deformed grating pattern is analyzed by use of 1-D dilating Gabor transform, and the fundamental frequency information is distinguished and extracted from the spectrum. Finally, a full original grating pattern is reconstructed to realize 3-D shape measurement. Experimental results show the validity of the above method.

关 键 词：信息光学 基准光栅重建 窗口傅里叶变换 傅里叶变换轮廓术 

分 类 号：O439[机械工程—光学工程]