基于边界扫描的板级互连测试及测试向量生成  

Board-level Interconnection Test and Test Vector Generation Based on Boundary-scan

作　　者：鲁长江[1] 王志刚[1] 兰京川[1] 

机构地区：[1]电子科技大学自动化工程学院,成都610054

出　　处：《自动化信息》2009年第11期49-50,61,共3页Automation Information

摘　　要：针对现有测试向量的不足，该文介绍了边界扫描的基本原理和结构并且分析了测试算法，重点论述了在互连测试中向边界扫描单元预装测试向量和提取响应的方法，最后提出了一种可施加于电路板扫描链上的测试向量生成方法。实验结果表明，该方法思路清晰，能够检测被测电路板中多条扫描链的固定0、固定1、短路和开路故障。Aiming at the shortages of existing test vector, the paper introduces the basic theory and architecture of boundary-scan and analyses the test algorithm, with focus on how to preload test vectors and how to get test responses for boundary-scanning elements in interconnect test. In addition, the paper proposes a method on test vectors generation that can he put on scan chains of the circuit board. The experimental result shows that the method is of clarity of thinking and can detect the faults of stack-at 0, stack-at 1 and open-short of multiple scan chains in the circuit board tested.

关 键 词：边界扫描 互连测试 测试向量 测试算法 

分 类 号：TP27[自动化与计算机技术—检测技术与自动化装置]